2008 IEEE SW Test Workshop
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Ken Karklin Touch Down Technologies |
Jerry Broz, Ph.D. International Test Solutions |
Bill Mann |
"Advanced Confocal Microscopy on a Process Capable Platform"
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Eddy Robinson, Ph.D. Hyphenated Systems |
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Rajiv Roy Rudolph Technologies |
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"Detecting
Killer Particles to Protect Multi-DUT Probe Cards"
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Amir Gilad Udi Efrat Guy Kafri Camtek |
DINNER SESSION
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Probe Year in
Review"
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Jerry Broz, Ph.D. |
Bill Mann Chair Emeritus SW Test Workshop |
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Keynote Speaker - "Wafer
Test Industries Impact on ATE"
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Debbora Ahlgren |
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CHAIRMAN'S WELCOME AND OVERVIEW
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Welcome
to Semiconductor Wafer (SW) Test Workshop 2008"
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Jerry Broz, Ph.D. |
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"SWTW Lifetime
Achievement Award" as presented by
Jerry Broz, Ph.D.
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Awarded to ... Don Snow CEO Emeritus Founder of Applied Precision, LLC. |
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Session 1 - MEMS FOR PRODUCTION-LEVEL PROBING
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Novel Method to
Store Spring Energy in Probes"
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Salleh Ismail, Ph.D. TouchDown Technologies |
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"Mechanical
Design of MEMS Probes for Wafer Test"
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Chris Folk Microfabrica |
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"MicroProbe Vx-MP
Probe Card Technology"
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January Kister Steve Hopkins Microprobe, Inc. |
Session 2 - ADVANCES IN TRADITIONAL PROBE CARD
TECHNOLOGIES
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"'Argon': A
new Epoxy Technology for Probing POA Power Devices"
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Raffaele Vallauri Massimo Gervasoni Luca Cecchetto Lucia Zullino STMicroelectronics |
Stefano Lazzari Riccardo Vettori Carlo Albini Technoprobe |
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"Vertical
Probe Alternative for Cantilever Pad Probing"
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Robert Doherty Analog Devices |
Robert Rogers Wentworth Labs |
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Winner -
Most Inspirational Presentation
"Automatic
Probe Assembly Machine"
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Jung-pyo Chun Dave Oh Kyung-hwan Kim TSE Co.,Ltd. |
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Session 3 - IMPROVING TEST CELL PERFORMANCE
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Mechanical
Simulation of Probing on SMART POWER POA Devices"
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Luca
Cecchetto |
Stefano Lazzari Riccardo Vettori Carlo Albini Technoprobe |
"Use
of On-Line Probe-to-Pad-Alignment (PTPA) Data to Improve Test Cell
Performance"
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Ernesto Cornejo Micron Technology |
"Statistical
Process Control for the Sort Area"
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Darren Coil Rudolph Technologies |
"ISMI
Wafer Probe Council Team Activities & Industry Perspectives"
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Boyd Daniels Texas Instruments |
Stu Crippen Intel Corporation |
Tom Wear ISMI SEMATECH |
Session 4 - POWER AND HIGH VOLTAGE
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
Winner - Best Presentation,
Tutorial in Nature
"Real-World
Avalanche Testing of Single-Die, Wafers, Hybrid Modules, and Packaged
Devices"
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Steven T. Clauter |
Taichi Ukai Taitech |
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"'Under
Pressure' - From High Voltage to MEMS Pressure Sensors Wafer Probing"
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Rainer
Gaggl, Ph. D. |
Session 5 - LARGE ARRAY PROBING
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
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Rod Doe Rudolph Technologies |
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"40k
Probes on 300mm Probe Card - another step towards 1 touchdown DRAM SORT"
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Michael Hubner, Ph.D. FormFactor |
"Electrical
Planarity Characterization of High Parallelism Probe Cards"
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John Caldwell Micron Technology |
"High-Performance
Contactors for Wafer-Scale Test (WST)"
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Jim Brandes Everett Charles Technologies |
Session 6 - PROBE POTPOURRI
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Comparison
of Drilling Rates and Tolerances of Laser-Drilled holes in Silicon
Nitride and Polyimide Vertical Probe Cards"
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Alan Ferguson, Ph.D. Oxford Laser |
"Non-contact
Test at Advanced Process Nodes"
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Chris Sallathamby, Ph.D. |
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"CO2 Composite Spray Technology for Probe Card Cleaning"
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David P. Jackson Cool Clean Technologies |
Session 7 - PROBE CARD CLEANING PRACTICES
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Probe
Card Cleaning Media Survey"
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Eric Hill Josh Smith Cascade Microtech |
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Winner - Best Technical Presentation
"Methodologies
for Assessing On-line Probe Process Parameters"
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Jan
Martens |
Simon
Allgaier |
Jerry Broz, Ph.D. |
Winner - Best Data Presentation
"VFPP-Very
Fine Pitch 60uM Probe Card Technology Optimization"
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John D Wolfe James Tong Norman Armendariz, Ph.D. Texas Instruments |
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Rob Marcelis Salland Engineering |
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Session 8 - STRATEGIC DESIGN METHODOLOGIES
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Design
for Probe"
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E Boyd Daniels Norm Armendariz, Ph.D. Texas Instruments |
"Globalization
and its Impact on the Probing Process"
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Manish
Gulati |
Alan
Romreill |
"Tangible
Value can be Realized by Standardizing Probe Interfaces"
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Keith Imai Semiconductor Test Consortium |
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"Accelerating CAD Design of Probe Cards Using Allegro System Architect"
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S. Dharmarajan Mike Goode Cadence |
Session 9 - PROBE CHALLENGES
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
"Effect
of Ground Return Path on Timing Accuracy"
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Gert Hohenwarter Gatewave Northern |
"Overcoming
the Challenges of Parallel RF Test"
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Roger
Hayward |
"An
Advanced Cantilever Probe Card with High Frequency Bandwidth (>3GHz) and
Experimental Result"
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Morgan Ku Phil Hsieh Jason Ho Sobers Chang Seenew Lai Dick Ho MPI / MJC Probe, Inc. |
POSTER SESSION
Top | Session 1
| Session 2 | Session 3 |
Session 4 | Session 5 |
Session 6 | Session 7 | Session 8 |
Session 9 | Poster
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CO2
Composite Spray Technology for Probe Card Cleaning |
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Winner - Best Poster Presentation |
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Unlocking
the Mystery of Precision Inductors in High Volume Production RF Test
Environments
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Advanced
Technology for High Parallelism Testing of Image Sensor Devices |
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Implementing
Tool Conversion Request (TCR) Protocol to Ensure the Effectiveness of
Copper Contamination Control |
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Manager
III + System Accuracy and Repeatability |
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Comparison of Laser Drilled Holes in Silicon Nitride and Polyimide
Vertical Probe Cards |
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Automatic Probe Assembling Machine
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SWTW 2007 Chairs:
Dr. Jerry Broz, International Test Solutions, General Chair
Brett Crump, Micron Technologies, Technical Program Chair
William Mann, Gneral Chair Emeritus
Maddie Harwood, CEM, Inc.,Finance Chair
Meredith M. Griffith, CEM, Inc., Registration / EXPO Coordinator
SWTW 2007 Steering Committee:
Nadine Aldahhan, Freescale Semiconductor
Jack Courtney, IBM Microelectronics
Warren "Stu" Crippen, Intel
Michael Egloff, AMD, Expo Coordinator
Michael Harris, Texas Instruments
Ken Karklin, Touchdown Technologies, Poster Session Coordinator / Program Committee
Ger Koch, NXP Semiconductor
Patrick Mui, JEM-America, Poster Session Coordinator / Program Committee
Rey Rincon, Integrated Test Corporation
Roger Sinsheimer, Xandex, Program Committee
Fred Taber, BiTS Workshop, Proceedings Coordinator
The presentations included
in the SWTW proceedings reflect the authors opinions and are presented
without change. Inclusion in the proceedings does not constitute an
endorsement by the SouthWest Test Workshop Committee, IEEE Computer
Society or the IEEE Test Technology Council.
Papers previously copyrighted or with copyright restrictions cannot be
presented. In keeping with a workshop environment and to avoid copyright
issues, SWTW does not officially seek a copyright ownership / transfer
from authors. Authors agree by submitting their work that their
presentation is original work and substantially not published previously
or copyrighted, may be referenced in the work of others, will be
assembled / distributed in the SWTW Proceedings, and made available for
download by anyone from the SWTW website.