Steering Committee Members for SW Test 2013:
Dr. Jerry Broz, Ph.D.,
International Test Solutions, General
Chair
Rey Rincon,
Freescale Semiconductor, Technical
Program Chair
Maddie Harwood,
CEM Inc., Finance
Chair
John Caldwell,
Micron Technology, Program Committee
Darren James,
Rudolph Technologies, Program Committee
Jan Martens,
NXP Semiconductor, Program Committee
Patrick Mui,
JEM America, Program Committee
Fred Taber,
BiTS Workshop, Proceedings Coordinator
Gunther Boehm,
FeinMetall GmbH
Michael Huebner,
Ph.D., FormFactor
Tatsuo Inoue,
Micronics Japan (MJC)
Amy Leong,
FormFactor / Microprobe
Clark Liu,
Powertech Technology, Inc. (PTI)
Mark Ojeda,
Spansion
Joey Wu,
MPI Corporation
The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee, IEEE CPMT Society, IEEE Computer Society or the IEEE Test Technology Council.
Papers previously copyrighted or with copyright restrictions cannot be presented. In keeping with a workshop environment and to avoid copyright issues, SWTW does not officially seek a copyright ownership / transfer from authors. Authors agree by submitting their work that their presentation is original work and substantially not published previously or copyrighted, may be referenced in the work of others, will be assembled / distributed in the SWTW Proceedings, and made available for download by anyone from the SWTW website.