SWTest 2020 Program


Awarded Presentations

Best Data Presentation Award

5G: How to be Heard in a Crowded Room

Author/Presenter: Daniel Bock, Ph.D.,FormFactor Inc.


Best Overall Presentation Award

Innovative Strategies for Improved Test Measurements using Kelvin Contacts with a Flying Prober

Authors/Presenters: Sebastiano Grimaldi, STMicroelectronics, Alessandro Antonioli, Ph.D., Technoprobe S.p.A.


AM Keynote Presentation

Moore’s Law and the Future of Test

Pooya Tadayon, Ph.D.
Intel Fellow
Technology and Manufacturing Group
Director, Test Probe Technology
Intel Corporation


PM Keynote Presentation

Probe in the Spotlight – enabling advanced packaging, chiplets, and heterogenous integration

Michael D. Slessor, Ph.D.
Chief Executive Officer
FormFactor, Inc.


Session #1

Session Chair: Geert Gouwy

Test Challenges and Solutions for Testing Wi-Fi 6E, UWB and 5G NR IF Devices in the 3-12 GHz Range

Author/Presenter: Jeorge Hurtarte, Ph.D., Teradyne, Inc.


5G: How to be Heard in a Crowded Room

Author/Presenter: Daniel Bock, Ph.D.,FormFactor Inc.


Session #2

Session Chair: Karen Armendariz, Celadon Systems, Inc.

SWT Crew


Opto-electronical probe card for high-volume wafer level test of photonic integrated circuits

Author/Presenter: Tobias Gnausch, Jenoptik, AG


Extending burn-in test at full wafer level to reduce overall cost of test at HVM

Authors/Presenters: Alessandro Antonioli, Technoprobe S.p.A., Sebastiano Grimaldi, STMicroelectronics


Challenges of Trench Probing

Authors/Presenters: Jory Twitchell, NXP Semiconductor, Karan Maniar, Nidec SV TCL


Session #3

Session Chair: Patrick Mui, JEM America Corp

High-speed PCB electrical characterization with good stability and repeatability

Authors/Presenters: Adolph Cheng, MPI Corporation, Steven Wu, MPI Corporation


Innovative strategies for improved test measurements using Kelvin contacts with a Flying prober

Authors/Presenters: Sebastiano Grimaldi, STMicroelectronics, Alessandro Antonioli, Technoprobe S.p.A.

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