Schedule-At-A-Glance

Start
19:00
19:30
20:00
20:30
21:00
21:30
22:00
22:30
23:00
23:30
EXPO Carry-In/Setup
 
EXPO Carry-In/Setup from 10/23 20:00 to 23:00
 

Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30

Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
21:00
21:30
Poster (Grand Foyer 1st floor)
 
Poster Session
 
Poster Session
 
Tech Showcase (Navis C 1st Floor)
 
MJC
 
Teraprobe:
 
EXPO (ARGOS C-F 1st Floor)
 
EXPO Open
EXPO Move-out
 
Japanese Street Food Festival (Olive/Garden 5th Floor)
 

Start
5:30
6:00
6:30
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
Charity Golf Tournament and Networking
2024 SWTest Asia Charity Golf Tournament (The Classic Golf Club)
 

Detailed Schedule

Time Event
20:00 - 23:00
EXPO Carry-In/Setup from 10/23 20:00 to 23:00

Time Event
7:30 - 9:30
EXPO Move-in
7:30 - 17:30
Attendees Registration Check-In
8:45 - 9:15
Fukuoka Governor Welcome
Jerry BROZ (SWTest Conference Chair, USA)
9:15 - 10:00
Speaker Headshot
Visionary Keynote
Silicon Seabelt 2.0: Challenges of Kyushu for Reproduction of Silicon Island
National Institute of Information - Japan
10:00 - 10:30
Break
10:00 - 10:30
Poster Session
Nyi Nyi THEIN (Western Digital Corporation , Japan)
10:00 - 17:30
EXPO Open
10:30 - 12:00
Session 1 Practical Test Solutions from MEMS, Power, and Optical
Session Chair: Eric Chia-Cheng CHANG (Intel, USA)
10:30 - 11:00
Novel True-Kelvin MEMS Analytical DC Probes to enable Accurate and Repeatable Characterization of Advanced-Node devices for AI applications
Choon Beng SIA (FormFactor Inc - Singapore), Masa WATANABE (FormFactor Japan - Japan)
Presenter HeadshotPresenter Headshot
11:00 - 11:30
Consideration of Resistance with Shared Power line for High Current device
Shoichi MATSUO (Micron Memory Japan Inc. - Japan)
Presenter Headshot
11:30 - 12:00
From Lab to Line: Enabling Efficient PIC Testing for Mass Production
Andrew YICK, Andy CHANG, Calvin YANG, Supreet KHANAPET (Marvell - USA), Christian KARRAS, Tobias GNAUSCH (Jenoptik - Germany)
Presenter Headshot
12:00 - 14:00
Lunch
14:00 - 15:30
Session 2 Innovative Testing Solutions for High-Performance Devices
Session Chair: Clark LIU (MJC Taiwan, Taiwan)
14:00 - 14:30
Addressing High-Speed Devices: Strengthening and Advancing MEMS Probe Cards
Masataka KIMOTO (MICRONICS JAPAN CO.,LTD - Japan), Yuka HOMAN (MICRONICS JAPAN CO.,LTD. - Japan), Shinji TANAKA (MICRONICS JAPAN - Japan)
Presenter HeadshotPresenter Headshot
14:30 - 15:00
A novel memory test system with an electromagnet for STT-MRAM wafer level testing
Masaharu TSUTA (Tohoku University - Japan), Masatomo TAKAHASHI (Accretech - Japan)